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  Recombination lifetime measurements in silicon/Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors..—West Conshohocken, PA :ASTM,c1998.
  392 p. :ill. ;24 cm.
  
  Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
  STP 1340.
  ASTM special technical publication ;;no. 1340
  Includes bibliographical references and indexes.

  ISBN0-8031-2489-9:CNY20.00
  Ⅰ.①Recombination lifetime measurements in silicon  Ⅱ.①Gupta, D. C.Bacher, Fred R.Hughes, William M.  Ⅲ.①Semiconductors - Congresses. - TestingService life (Engineering) - Congresses. - ForecastingElectronic measurements - Congresses.  Ⅳ.①TN304.07-532②TK7871.852③621.3815/2

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